A rise in Industry 4.0 technologies emphasises the need for instantaneous data access, supporting better-informed decision-making across various fields. While such advancements are most common in manufacturing, many other 'point four' paradigms are also embracing always-on, data-driven results. Here, Franz Kamutzki, Senior Sales Account Manager at industrial electron microscopy specialist, Thermo Fisher Scientific, discusses how scanning electron microscopy plays a key role in Materials 4.0 to meet the complex material characterisation needs of scientists.
Materials 4.0 represents the convergence of advanced digital technologies with traditional materials science. Inspired by Industry 4.0 principles, this approach leverages big data, high-throughput experimentation, and integrated computational tools to transform how scientists design, characterise, and use materials. However, bringing Materials 4.0 to fruition for scanning electron microscopy can be difficult and costly, requiring enhanced IT infrastructure and advanced training for staff. Additionally, scaling these technologies across departments presents further challenges.
Also read: Industry 4.0: The impacts on manufacturing
What Makes a Scanning Electron Microscopy System Ready for Materials 4.0?
For scanning electron microscopy to support Materials 4.0, the system must integrate easily into existing laboratory setups and streamline data management. This compatibility includes high-resolution imaging capabilities to accurately examine surface features such as grain boundaries and defects, with built-in lab automation tools to simplify data acquisition.
Advanced scanning electron microscopes incorporate essential features into a single platform, eliminating the need for multiple systems or software. This integration includes tools like Energy Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) for obtaining both high-resolution images and chemical composition data in real-time. A suitable system must support high-resolution data collection, automated analysis, and seamless integration with machine learning algorithms to enable complex microstructural analysis.
The Role of Scanning Electron Microscopy in Materials Analysis
Scanning electron microscopy is indispensable for data-driven material characterisation and analysis. Technologies like EBSD enable scientists to analyse the crystallographic orientation and phase distribution of materials at the microstructural level. EBSD detects and analyses diffraction patterns from backscattered electrons, providing detailed maps of grain orientation, phase identification, and strain distribution—data that are critical for Materials 4.0 applications.
For instance, researchers studying solid-state batteries can monitor the behaviouof the generally crystalline cathode materials using EBSD. This technique enables scientists to investigate aspects such as texture, grain size, and boundary distributions, which are often linked to the electrochemical performance of the cathode and, consequently, the battery.
A New Approach to SEM and Materials Characterisation
Incorporating EDS and EBSD into a single scanning electron microscopy system enables comprehensive data acquisition in a single setup, enhancing both the accuracy and efficiency of materials analysis. This integration supports in-depth examination of materials, allowing engineers and scientists to obtain both visual and compositional data simultaneously. In the example of lithium-ion batteries, combining EDS with SEM enables researchers to observe lithium dendrite formation in real-time and analyse their chemical composition as they form, without needing additional systems.
Thermo Fisher Scientific’s ChemiSEM technology integrates traditional SEM imaging with real-time elemental analysis, simplifying sample analysis by embedding chemical composition directly into SEM images. This innovation enhances productivity and reduces analysis complexity.
A Fully Integrated SEM System for Materials 4.0
The Thermo Scientific Apreo SEM, equipped with ChemiSEM technology, combines SEM, EDS, and EBSD analytics in one streamlined platform, removing the need for multiple systems. Users can acquire, store, share, and analyse material data through this single interface. The Apreo ChemiSEM enables advanced materials analysis without requiring specialized training, making it accessible for all users. Furthermore, by consolidating service, support, and sales advice into one Thermo Fisher contact, laboratories benefit from an easier support process and can maximize their investment in scanning electron microscopy.
As demand for data-driven decision-making grows across industries, materials analysis must evolve to meet these expectations. Integrable, user-friendly analytics tools enable a shift toward automation, removing the need for an equipment overhaul and specialised expertise. Scanning electron microscopy will continue to be fundamental in characterizing and analysing materials, and with the latest SEM technology, Materials 4.0 will truly come to fruition
